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Friday, October 23, 2009

As quality and Six Sigma excellence has become a decisive factor in global market competition, quality control techniques such as Statistical Process Control (SPC) and Engineering Process Control (EPC) are becoming popular in industries. With advances in information, sensing, and data capture technology, large volumes of data are being routinely collected and shared over multiple-stage processes, which has a growing impact on the existing SPC and EPC methods. This talk will discuss several technical challenges and present some recent extensions in this area such as profile monitoring, engineering-controlled process monitoring, and multistage SPC.

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